HOME > Article > DetailRound-robin layer-thickness determination: Toward reliable reference-free X-ray spectrometryKenji Sakurai, Akira Kurokawa. X-Ray Spectrometry 48 [1] 3-7. 2019.https://doi.org/10.1002/xrs.2978 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-03-01 11:36:59 +0900Updated at: 2024-05-01 05:18:50 +0900
