HOME > Article > DetailInformatics-Aided Raman Microscopy for Nanometric 3D Stress CharacterizationHongxin Wang, Han Zhang, Bo Da, Motoki Shiga, Hideaki Kitazawa, Daisuke Fujita. The Journal of Physical Chemistry C 122 [13] 7187-7193. 2018.https://doi.org/10.1021/acs.jpcc.7b12415 NIMS author(s)ZHANG, HanKITAZAWA, HideakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-04-11 21:02:59 +0900 Updated at: 2026-11-04 06:38:02 +0900
