HOME > 論文 > 書誌詳細Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline MaterialsSeiichiro Ii. Materials 17 [3] 578. 2024.https://doi.org/10.3390/ma17030578 Open Access MDPI AG (Publisher) Materials Data Repository (MDR) NIMS著者井 誠一郎Materials Data Repository (MDR)上の本文・データセットMDRavailable Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials 作成時刻: 2024-02-09 03:10:16 +0900更新時刻: 2024-05-01 10:10:05 +0900
