HOME > Article > DetailQuantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline MaterialsSeiichiro Ii. Materials 17 [3] 578. 2024.https://doi.org/10.3390/ma17030578 Open Access MDPI AG (Publisher) Materials Data Repository (MDR) NIMS author(s)II, SeiichiroFulltext and dataset(s) on Materials Data Repository (MDR)MDRavailable Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials Created at: 2024-02-09 03:10:16 +0900 Updated at: 2025-04-12 10:25:52 +0900