HOME > Article > DetailGlobal Standardization of Scanning Probe MicroscopyDaisuke Fujita, Hiroshi Itoh, Shingo Ichimura, Tomizo Kurosawa. Nanotechnology 18 [8] 084002. 2007.https://doi.org/10.1088/0957-4484/18/8/084002 NIMS author(s)FUJITA, DaisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:10:07 +0900Updated at: 2024-04-01 18:21:36 +0900