HOME > 論文 > 書誌詳細Characterization of wide-gap semiconductors by photothermal deflection spectroscopyMasatomo Sumiya. Japanese Journal of Applied Physics 62 [SN] SN1007. 2023.https://doi.org/10.35848/1347-4065/ace3cf Open Access IOP Publishing (Publisher) NIMS著者角谷 正友Materials Data Repository (MDR)上の本文・データセット作成時刻: 2023-08-22 03:28:14 +0900更新時刻: 2024-09-05 10:19:20 +0900
