HOME > Article > DetailCharacterization of wide-gap semiconductors by photothermal deflection spectroscopyMasatomo Sumiya. Japanese Journal of Applied Physics 62 [SN] SN1007. 2023.https://doi.org/10.35848/1347-4065/ace3cf Open Access IOP Publishing (Publisher) Materials Data Repository (MDR) NIMS author(s)SUMIYA, MasatomoFulltext and dataset(s) on Materials Data Repository (MDR)MDRavailable Characterization of wide-gap semiconductors by photothermal deflection spectroscopy Created at: 2023-08-22 03:28:14 +0900 Updated at: 2026-09-29 09:37:52 +0900
