Nanometer scale X-ray absorption spectroscopy and chemical states mapping of ultra thin oxides on Silicon using Electrostatic Force Microscopy (静電気力プローブ顕微鏡を使った極薄Si酸化膜のナノメートルX線分光と化学状態マッピング)
M. Ishii, B. Hamilton, N. R. J. Poolton, N. Rigopoulos, S. De Gendt, K. Sakurai.