電子線誘起電流(EBIC)法を用いた多結晶シリコンにおける粒界の電気的活性度評価
(Characterizxation of electrical activity of grain boundaries in multicrystalline Si)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 15:04:31 +0900 Updated at: 2018-12-14 23:35:47 +0900