HOME > 論文 > 書誌詳細Electron-beam-induced current study of grain boundaries in multicrystalline siliconJ. Chen, T. Sekiguchi, D. Yang, F. Yin, K. Kido, S. Tsurekawa. Journal of Applied Physics 96 [10] 5490-5495. 2004.https://doi.org/10.1063/1.1797548 NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:35:59 +0900更新時刻: 2024-03-29 20:16:13 +0900
