HOME > Article > DetailElectron-beam-induced current study of grain boundaries in multicrystalline siliconJ. Chen, T. Sekiguchi, D. Yang, F. Yin, K. Kido, S. Tsurekawa. Journal of Applied Physics 96 [10] 5490-5495. 2004.https://doi.org/10.1063/1.1797548 NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:35:59 +0900 Updated at: 2026-09-28 04:28:32 +0900
