HOME > 論文 > 書誌詳細Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulatorHiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, Masato Okada. Journal of Electron Spectroscopy and Related Phenomena 267 147370. 2023.https://doi.org/10.1016/j.elspec.2023.147370 Open Access Elsevier BV (Publisher) Materials Data Repository (MDR) NIMS著者篠塚 寛志永田 賢二吉川 英樹Materials Data Repository (MDR)上の本文・データセットMDRavailable Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator 作成時刻: 2023-08-25 03:31:18 +0900更新時刻: 2024-05-01 09:54:16 +0900
