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Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

Hiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, Masato Okada.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


Created at: 2023-08-25 03:31:18 +0900Updated at: 2024-09-05 10:19:52 +0900

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