HOME > 論文 > 書誌詳細Direct Observation of Valence and Conduction States near the SiO2/Si(100) InterfaceYoshiyuki Yamashita, Susumu Yamamoto, Kozo Mukai, Jun Yoshinobu, Yoshihisa Harada, Takashi Tokushima, Shik Shin. e-Journal of Surface Science and Nanotechnology 6 209-212. 2008.https://doi.org/10.1380/ejssnt.2008.209 Open Access 出版者 (Publisher) NIMS著者山下 良之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:35:45 +0900更新時刻: 2024-03-29 17:33:26 +0900
