HOME > Article > DetailDirect Observation of Valence and Conduction States near the SiO2/Si(100) InterfaceYoshiyuki Yamashita, Susumu Yamamoto, Kozo Mukai, Jun Yoshinobu, Yoshihisa Harada, Takashi Tokushima, Shik Shin. e-Journal of Surface Science and Nanotechnology 6 209-212. 2008.https://doi.org/10.1380/ejssnt.2008.209 Open Access 出版者 (Publisher) NIMS author(s)YAMASHITA, YoshiyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2016-05-24 15:35:45 +0900 Updated at :2020-11-16 23:02:03 +0900