HOME > 論文 > 書誌詳細Electron-Beam Induced Current Study of Electrical activity of dislocations in 4H-SiC homoepitaxial filmsCHEN, Bin, CHEN, Jun, SEKIGUCHI, Takashi, Akimasa Kinishita, Hirofumi Matsuhata, Hirotaka Yamaguchi, Ichirou Nagai, Hajime Okumura. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS S219-S223. 2008.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:33:17 +0900更新時刻: 2022-10-21 22:33:17 +0900
