A New Technique for Enhancing Sensitivity of the 2ω Method by Applying a Bismuth Film Thermoreflectance Sensor on Top of the Metal Film–Dielectric Substrate Sample | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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A New Technique for Enhancing Sensitivity of the 2ω Method by Applying a Bismuth Film Thermoreflectance Sensor on Top of the Metal Film–Dielectric Substrate Sample
(Physics 50 (2011) 046602)

Ryozo Kato, Yibin Xu, Masahiro Goto.

Japanese Journal of Applied Physics 50 [4] 046602. 2011.

https://doi.org/10.1143/jjap.50.046602

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作成時刻: 2016-05-24 16:19:11 +0900更新時刻: 2024-04-02 04:18:30 +0900

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