HOME > 論文 > 書誌詳細Bias-voltage-dependent measurement of apparent barrier height on low-work-function thin filmKatsumi Nagaoka, Shun-ichiro Ohmi. Journal of Vacuum Science & Technology B 38 [6] 062801. 2020.https://doi.org/10.1116/6.0000436 NIMS著者長岡 克己Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-10-28 03:00:20 +0900 更新時刻: 2026-09-29 05:38:44 +0900
