HOME > 論文 > 書誌詳細Thickness measurements with electron energy loss spectroscopyK. Iakoubovskii, K. Mitsuishi, Y. Nakayama, K. Furuya. Microscopy Research and Technique 71 [8] 626-631. 2008.https://doi.org/10.1002/jemt.20597 NIMS著者三石 和貴中山 佳子Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:33:32 +0900更新時刻: 2024-04-01 18:57:21 +0900
