HOME > Article > DetailThickness measurements with electron energy loss spectroscopyK. Iakoubovskii, K. Mitsuishi, Y. Nakayama, K. Furuya. Microscopy Research and Technique 71 [8] 626-631. 2008.https://doi.org/10.1002/jemt.20597 NIMS author(s)MITSUISHI, KazutakaNAKAYAMA, YoshikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:33:32 +0900Updated at: 2024-05-02 05:43:42 +0900
