HOME > 論文 > 書誌詳細Quantitative secondary ion mass spectrometric analysis of secondary ion polarity in GaN films implanted with oxygenMinako Hashiguchi, Isao Sakaguchi, Yutaka Adachi, Naoki Ohashi. Japanese Journal of Applied Physics 55 [10] 101001. 2016.https://doi.org/10.7567/jjap.55.101001 NIMS著者坂口 勲安達 裕大橋 直樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-10-26 15:44:26 +0900 更新時刻: 2026-10-03 05:10:24 +0900
