HOME > 論文 > 書誌詳細Determination of crystallographic chirality of MnSi thin film grown on Si (111) substrateDaisuke Morikawa, Yuichi Yamasaki, Naoya Kanazawa, Tomoyuki Yokouchi, Yoshinori Tokura, Taka-hisa Arima. Physical Review Materials 4 [1] 014407. 2020.https://doi.org/10.1103/physrevmaterials.4.014407 NIMS著者山崎 裕一Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-06-12 03:00:19 +0900更新時刻: 2024-08-10 05:20:19 +0900
