HOME > Article > DetailDetermination of crystallographic chirality of MnSi thin film grown on Si (111) substrateDaisuke Morikawa, Yuichi Yamasaki, Naoya Kanazawa, Tomoyuki Yokouchi, Yoshinori Tokura, Taka-hisa Arima. Physical Review Materials 4 [1] 014407. 2020.https://doi.org/10.1103/physrevmaterials.4.014407 NIMS author(s)YAMASAKI, YuichiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-06-12 03:00:19 +0900Updated at: 2024-04-02 02:02:02 +0900
