HOME > 論文 > 書誌詳細Atomic force microscopy measurement of the Young's modulus and hardness of single LaB6 nanowiresHan Zhang, Jie Tang, Lin Zhang, Bai An, Lu-Chang Qin. Applied Physics Letters 92 [17] 173121. 2008.https://doi.org/10.1063/1.2919718 NIMS著者張 晗Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:33:06 +0900 更新時刻: 2026-09-30 05:26:54 +0900
