HOME > 論文 > 書誌詳細Characterization of defect structure in zinc oxide films doped with impurity(不純物添加した酸化亜鉛基薄膜の欠陥構造の評価)RYOKEN, Haruki, SAKAGUCHI, Isao, OGAKI, Takeshi, ADACHI, Yutaka, OHASHI, Naoki, HANEDA, Hajime. KEY ENGINEERING MATERIALS 75-78. 2006.NIMS著者坂口 勲大垣 武安達 裕大橋 直樹羽田 肇Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:03:11 +0900更新時刻: 2022-10-21 22:03:11 +0900
