HOME > 論文 > 書誌詳細Effect of Mg insertion on stress-induced resistance drift in MgO-based magnetic tunnel junctionsC. M. Choi, Y.H. Song, J. Y. Lee, Y. T. Oh, H. Sukegawa, S. Mitani. Electronics Letters 52 [7] 531-533. 2016.https://doi.org/10.1049/el.2015.4299 NIMS著者介川 裕章三谷 誠司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-12-14 00:00:28 +0900更新時刻: 2024-10-07 05:17:02 +0900
