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Effect of Mg insertion on stress-induced resistance drift in MgO-based magnetic tunnel junctions

C. M. Choi, Y.H. Song, J. Y. Lee, Y. T. Oh, H. Sukegawa, S. Mitani.
Electronics Letters 52 [7] 531-533. 2016.
https://doi.org/10.1049/el.2015.4299

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