HOME > 論文 > 書誌詳細Electron capture by vacancy-type defects in carbon-doped GaN studied using monoenergetic positron beamsAkira Uedono, Taketoshi Tanaka, Norikazu Ito, Ken Nakahara, Werner Egger, Christoph Hugenschmidt, Shoji Ishibashi, Masatomo Sumiya. Thin Solid Films 639 78-83. 2017.https://doi.org/10.1016/j.tsf.2017.08.021 NIMS著者角谷 正友Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-01-18 20:43:48 +0900更新時刻: 2024-04-01 22:08:08 +0900
