Electron capture by vacancy-type defects in carbon-doped GaN studied using monoenergetic positron beams

Akira Uedono, Taketoshi Tanaka, Norikazu Ito, Ken Nakahara, Werner Egger, Christoph Hugenschmidt, Shoji Ishibashi, Masatomo Sumiya.

Thin Solid Films 639 78-83. 2017.

Created at: 2018-01-18 20:43:48 +0900Updated at: 2024-04-01 22:08:08 +0900