Direct Observation of Local Shielding Currents in Superconducting Thin Films under Low Magnetic Field by Scanning Superconducting Quantum Interference Device Microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Direct Observation of Local Shielding Currents in Superconducting Thin Films under Low Magnetic Field by Scanning Superconducting Quantum Interference Device Microscopy
(超伝導薄膜中の遮蔽電流の走査SQUID顕微鏡による直接観察)

Shunichi Arisawa, Kazuya Mochiduki, Kyungsung Yun, Takeshi Hatano, Ienari Iguchi, Kazuhiro Endo.

Japanese Journal of Applied Physics 51 095804. 2012.

https://doi.org/10.1143/jjap.51.095804

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作成時刻: 2016-05-24 16:25:08 +0900更新時刻: 2024-04-02 04:13:23 +0900

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