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High-throughput XPS spectrum modeling with autonomous background subtraction for 3d5/2 peak mapping of SnS

著者Tarojiro Matsumura, Naoka Nagamura, Shotaro Akaho, Kenji Nagata, Yasunobu Ando.
掲載誌名Science and Technology of Advanced Materials: Methods 3 [1]
ISSN: 27660400
出版社Informa UK Limited
発表年2023
言語English
DOIhttps://doi.org/10.1080/27660400.2022.2159753
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