High-throughput XPS spectrum modeling with autonomous background subtraction for 3 <i>d</i> <sub>5/2</sub> peak mapping of SnS | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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High-throughput XPS spectrum modeling with autonomous background subtraction for 3 d _5/2 peak mapping of SnS

Tarojiro Matsumura, Naoka Nagamura, Shotaro Akaho, Kenji Nagata, Yasunobu Ando.

Science and Technology of Advanced Materials: Methods 3 [1] 2159753. 2023.

https://doi.org/10.1080/27660400.2022.2159753

Open Access Informa UK Limited (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-05-10 03:39:37 +0900更新時刻: 2025-01-09 09:16:45 +0900

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