HOME > Article > DetailHigh-throughput XPS spectrum modeling with autonomous background subtraction for 3 d 5/2 peak mapping of SnSTarojiro Matsumura, Naoka Nagamura, Shotaro Akaho, Kenji Nagata, Yasunobu Ando. Science and Technology of Advanced Materials: Methods 3 [1] 2159753. 2023.https://doi.org/10.1080/27660400.2022.2159753 Open Access Informa UK Limited (Publisher) NIMS author(s)NAGAMURA, NaokaNAGATA, KenjiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-05-10 03:39:37 +0900Updated at: 2025-02-10 09:23:39 +0900