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Conduction Tuning of Graphene Based on Defect-Induced Localization
(欠陥起因の電荷局在によるグラフェンの電気伝導制御)

Shu Nakaharai, Tomohiko Iijima, Shinichi Ogawa, Shingo Suzuki, Song-Lin Li, Kazuhito Tsukagoshi, Shintaro Sato, Naoki Yokoyama.
ACS Nano 7 [7] 5694-5700. 2013.
https://doi.org/10.1021/nn401992q

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