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In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface

Esmaeil Adabifiroozjaei, Ebad Rastkerdar, Yoshihiro Nemoto, Yoshiko Nakayama, Yuki Nishimiya, Marco Fronzi, Yin Yao, Minh Triet Nguyen, Leopoldo Molina-Luna, Tohru S. Suzuki.
Journal of Materials Science 58 [6] 2456-2468. 2023.

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    作成時刻: 2023-03-01 03:36:57 +0900更新時刻: 2024-07-03 08:52:30 +0900

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