HOME > 論文 > 書誌詳細In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interfaceEsmaeil Adabifiroozjaei, Ebad Rastkerdar, Yoshihiro Nemoto, Yoshiko Nakayama, Yuki Nishimiya, Marco Fronzi, Yin Yao, Minh Triet Nguyen, Leopoldo Molina-Luna, Tohru S. Suzuki. Journal of Materials Science 58 [6] 2456-2468. 2023.https://doi.org/10.1007/s10853-023-08186-z Open Access Springer Science and Business Media LLC (Publisher) NIMS著者根本 善弘中山 佳子西宮 ゆき鈴木 達Materials Data Repository (MDR)上の本文・データセット作成時刻: 2023-03-01 03:36:57 +0900更新時刻: 2024-05-01 08:42:35 +0900
