HOME > Article > DetailIn-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interfaceEsmaeil Adabifiroozjaei, Ebad Rastkerdar, Yoshihiro Nemoto, Yoshiko Nakayama, Yuki Nishimiya, Marco Fronzi, Yin Yao, Minh Triet Nguyen, Leopoldo Molina-Luna, Tohru S. Suzuki. Journal of Materials Science 58 [6] 2456-2468. 2023.https://doi.org/10.1007/s10853-023-08186-z Open Access Springer Science and Business Media LLC (Publisher) NIMS author(s)NEMOTO, YoshihiroNAKAYAMA, YoshikoNISHIMIYA, YukiSUZUKI, TohruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-03-01 03:36:57 +0900 Updated at: 2025-11-19 08:27:46 +0900
