HOME > Article > DetailAnalyses of oxygen precipitates in CZ-Si by X-ray diffuse scattering using parallel X-ray beamTomoyuki Horikawa, Yoshiyuki Tsusaka, Junji Matsui, Tetsuya Tohei, Yusuke Hayashi, Akira Sakai. Japanese Journal of Applied Physics 64 [4] 045502. 2025.https://doi.org/10.35848/1347-4065/adc0d3 Open Access Materials Data Repository (MDR) NIMS author(s)HAYASHI, YusukeFulltext and dataset(s) on Materials Data Repository (MDR)MDRavailable Analyses of oxygen precipitates in CZ-Si by X-ray diffuse scattering using parallel X-ray beam Created at: 2025-07-23 03:08:51 +0900 Updated at: 2026-10-08 09:11:30 +0900
