HOME > Article > DetailNF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopyAsahiko Matsuda, Takashi Teramoto, Takahiro Nagata, Dominic Gerlach, Peng Shen, Shigenori Ueda, Takako Kimura, Christian Dussarrat, Toyohiro Chikyow. Applied Surface Science 659 159941. 2024.https://doi.org/10.1016/j.apsusc.2024.159941 NIMS author(s)MATSUDA, AsahikoNAGATA, TakahiroUEDA, ShigenoriCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2024-03-28 09:53:17 +0900Updated at: 2025-02-10 10:30:23 +0900