SAMURAI - NIMS Researchers Database

HOME > Article > Detail

NF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy

Asahiko Matsuda, Takashi Teramoto, Takahiro Nagata, Dominic Gerlach, Peng Shen, Shigenori Ueda, Takako Kimura, Christian Dussarrat, Toyohiro Chikyow.
Applied Surface Science 659 159941. 2024.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2024-03-28 09:53:17 +0900Updated at: 2025-02-10 10:30:23 +0900

    ▲ Go to the top of this page