HOME > Article > DetailCorrelation between residual strain and electrically active grain boundaries in multicrystalline siliconJun Chen, Bin Chen, Takashi Sekiguchi, Masayuki Fukuzawa, Masayoki Yamada. Applied Physics Letters 93 [11] 112105. 2008.https://doi.org/10.1063/1.2983649 NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:35:29 +0900Updated at: 2024-04-01 18:52:10 +0900