Correlation between residual strain and electrically active grain boundaries in multicrystalline silicon | SAMURAI, NIMS Researchers Directory Service

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Correlation between residual strain and electrically active grain boundaries in multicrystalline silicon

Jun Chen, Bin Chen, Takashi Sekiguchi, Masayuki Fukuzawa, Masayoki Yamada.

Applied Physics Letters 93 [11] 112105. 2008.

https://doi.org/10.1063/1.2983649

NIMS author(s)

CHEN, Jun

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 15:35:29 +0900 Updated at: 2026-09-30 05:25:46 +0900

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