HOME > 論文 > 書誌詳細Correlation between residual strain and electrically active grain boundaries in multicrystalline siliconJun Chen, Bin Chen, Takashi Sekiguchi, Masayuki Fukuzawa, Masayoki Yamada. Applied Physics Letters 93 [11] 112105. 2008.https://doi.org/10.1063/1.2983649 NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:35:29 +0900 更新時刻: 2026-09-30 05:25:46 +0900
