Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
(Thickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry)

Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran, Kenji Watanabe, Takashi Taniguchi, Hadar Steinberg, Ronen Rapaport.

ACS Nano 17 [10] 9188-9196. 2023.

https://doi.org/10.1021/acsnano.2c12773

Open Access American Chemical Society (ACS) (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-06-07 00:45:23 +0900更新時刻: 2024-03-31 19:32:23 +0900

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