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Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI 2
(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)

Dmitry Lebedev, Jonathan Tyler Gish, Ethan Skyler Garvey, Teodor Kosev Stanev, Junhwan Choi, Leonidas Georgopoulos, Thomas Wei Song, Hong Youl Park, Kenji Watanabe, Takashi Taniguchi, Nathaniel Patrick Stern, Vinod Kumar Sangwan, Mark Christopher Hersam.
Advanced Functional Materials 33 [12] 2212568. 2023.
Open Access Wiley (Publisher)

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2023-03-30 03:40:56 +0900Updated at: 2024-05-03 03:01:52 +0900

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