Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2

Dmitry Lebedev; Jonathan Tyler Gish; Ethan Skyler Garvey; Teodor Kosev Stanev; Junhwan Choi; Leonidas Georgopoulos; Thomas Wei Song; Hong Youl Park; Kenji Watanabe; Takashi Taniguchi; Nathaniel Patrick Stern; Vinod Kumar Sangwan; Mark Christopher Hersam

doi:10.1002/adfm.202212568

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Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI 2
(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)

Dmitry Lebedev, Jonathan Tyler Gish, Ethan Skyler Garvey, Teodor Kosev Stanev, Junhwan Choi, Leonidas Georgopoulos, Thomas Wei Song, Hong Youl Park, Kenji Watanabe, Takashi Taniguchi, Nathaniel Patrick Stern, Vinod Kumar Sangwan, Mark Christopher Hersam.

Advanced Functional Materials 33 [12] 2212568. 2023.

https://doi.org/10.1002/adfm.202212568

Open Access Wiley (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-03-30 03:40:56 +0900更新時刻: 2024-04-19 03:01:47 +0900

Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI 2(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI 2
(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)