Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI
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Dmitry Lebedev; Jonathan Tyler Gish; Ethan Skyler Garvey; Teodor Kosev Stanev; Junhwan Choi; Leonidas Georgopoulos; Thomas Wei Song; Hong Youl Park; Kenji Watanabe; Takashi Taniguchi; Nathaniel Patrick Stern; Vinod Kumar Sangwan; Mark Christopher Hersam; Dmitry Lebedev; Jonathan Tyler Gish; Ethan Skyler Garvey; Teodor Kosev Stanev; Junhwan Choi; Leonidas Georgopoulos; Thomas Wei Song; Hong Youl Park; Kenji Watanabe; Takashi Taniguchi; Nathaniel Patrick Stern; Vinod Kumar Sangwan; Mark Christopher Hersam

doi:10.1002/adfm.202212568

Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI ₂
(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)

Dmitry Lebedev, Jonathan Tyler Gish, Ethan Skyler Garvey, Teodor Kosev Stanev, Junhwan Choi, Leonidas Georgopoulos, Thomas Wei Song, Hong Youl Park, Kenji Watanabe, Takashi Taniguchi, Nathaniel Patrick Stern, Vinod Kumar Sangwan, Mark Christopher Hersam.

Advanced Functional Materials 33 [12] 2212568. 2023.

https://doi.org/10.1002/adfm.202212568

Open Access Wiley (Publisher) Materials Data Repository (MDR)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI <sub>2</sub>

Created at: 2023-03-30 03:40:56 +0900 Updated at: 2026-09-29 08:34:16 +0900

Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI 2(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI ₂
(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)