Electrical Interrogation of Thickness‐Dependent Multiferroic Phase Transitions in the 2D Antiferromagnetic Semiconductor NiI 2
(Electrical Interrogation of Thickness-Dependent Multiferroic Phase Transitions in the Two-Dimensional Antiferromagnetic Semiconductor NiI2)

著者	Dmitry Lebedev, Jonathan Tyler Gish, Ethan Skyler Garvey, Teodor Kosev Stanev, Junhwan Choi, Leonidas Georgopoulos, Thomas Wei Song, Hong Youl Park, Kenji Watanabe, Takashi Taniguchi, Nathaniel Patrick Stern, Vinod Kumar Sangwan, Mark Christopher Hersam, Dmitry Lebedev, Jonathan Tyler Gish, Ethan Skyler Garvey, Teodor Kosev Stanev, Junhwan Choi, Leonidas Georgopoulos, Thomas Wei Song, Hong Youl Park, Nathaniel Patrick Stern, Vinod Kumar Sangwan, Mark Christopher Hersam.
掲載誌名	Advanced Functional Materials 33 [12] 2212568 ISSN: 16163028, 1616301X ESIでのカテゴリ: MATERIALS SCIENCE
出版社	Wiley
発表年	2023
言語	English
DOI	https://doi.org/10.1002/adfm.202212568
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