HOME > 論文 > 書誌詳細X-ray Absorption Fine Structural Study of Atomic Structures and Chemical States of Dopants in 4H-SiC(0001)Yuhua Tsai, Jingmin Tang, Yoshiyuki Yamashita. ACS Applied Electronic Materials 5 [7] 3843-3850. 2023.https://doi.org/10.1021/acsaelm.3c00546 NIMS著者山下 良之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2023-07-29 03:25:38 +0900更新時刻: 2024-10-13 08:36:25 +0900
