HOME > 論文 > 書誌詳細Reliable Nonvolatile Memory Black Phosphorus Ferroelectric Field-Effect Transistors with van der Waals BufferShili Yan, Hai Huang, Zhijian Xie, Guojun Ye, Xiao-Xi Li, Takashi Taniguchi, Kenji Watanabe, Zheng Han, Xianhui Chen, Jianlu Wang, Jian-Hao Chen. ACS Applied Materials & Interfaces 11 [45] 42358-42364. 2019.https://doi.org/10.1021/acsami.9b15457 NIMS著者谷口 尚渡邊 賢司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-03-11 03:00:30 +0900 更新時刻: 2026-11-08 05:01:55 +0900
