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Resistance random access memory performance of MgZnO-based device with varying film thickness by an asymmetric electrode of Au/ITO

Zilong Zhang, Keyun Gu, Xinyu Zhou, Haofei Huang, Jian Huang, Ke Tang, Jieyu Zhang, Meiyong Liao, Linjun Wang.
Materialia 15 101001. 2021.

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    作成時刻: 2021-01-21 03:00:18 +0900更新時刻: 2024-09-12 05:13:02 +0900

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