HOME > 論文 > 書誌詳細Precise resistivity measurement of submicrometer-sized materials by using TEM with microprobes(TEM内局所導電性評価手法の高精度化)N. Kawamoto, Y. Murakami, D. Shindo, H. Azehara, H. Tokumoto. MATERIALS TRANSACTIONS 50 [6] 1572-1575. 2009.https://doi.org/10.2320/matertrans.m2009031 NIMS著者川本 直幸Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:00:28 +0900更新時刻: 2024-09-07 06:05:17 +0900
