Precise resistivity measurement of submicrometer-sized materials by using TEM with microprobes
(TEM内局所導電性評価手法の高精度化)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 16:00:28 +0900 Updated at: 2026-11-02 05:53:00 +0900