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著者名Frédéric Joucken, Jose Avila, Zhehao Ge, Hemian Yi, Eberth A. Quezada-Lopez, Romaric Le Goff, Kenji Watanabe, Emmanuel Baudin, John L. Davenport, Takashi Taniguchi, Maria Carmen Asensio, Jairo Velasco.
タイトルVisualizing the Effect of an Electrostatic Gate with Angle-Resolved Photoemission Spectroscopy
(Visualizing the effect of an electrostatic gate with angle-resolved photoemission spectroscopy)
掲載誌名NANO LETTERS 2682 2687
発表年2019
言語English
DOI10.1021/acs.nanolett.9b00649
ESIでのカテゴリ
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