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Visualizing the Effect of an Electrostatic Gate with Angle-Resolved Photoemission Spectroscopy
(Visualizing the effect of an electrostatic gate with angle-resolved photoemission spectroscopy)

著者Frédéric Joucken, Jose Avila, Zhehao Ge, Eberth A. Quezada-Lopez, Hemian Yi, Romaric Le Goff, Emmanuel Baudin, John L. Davenport, Kenji Watanabe, Takashi Taniguchi, Maria Carmen Asensio, Jairo Velasco.
掲載誌名Nano Letters 19 [4] 2682-2687
ISSN: 15306992, 15306984
ESIでのカテゴリ: PHYSICS
出版社American Chemical Society (ACS)
発表年2019
言語English
DOIhttps://doi.org/10.1021/acs.nanolett.9b00649
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