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AuthorFrédéric Joucken, Jose Avila, Zhehao Ge, Eberth A. Quezada-Lopez, Hemian Yi, Romaric Le Goff, Emmanuel Baudin, John L. Davenport, Kenji Watanabe, Takashi Taniguchi, Maria Carmen Asensio, Jairo Velasco.
TitleVisualizing the Effect of an Electrostatic Gate with Angle-Resolved Photoemission Spectroscopy
(Visualizing the effect of an electrostatic gate with angle-resolved photoemission spectroscopy)
Journal titleNano Letters 19 [4] 2682-2687
ISSN: 15306984
Year of publication2019
LanguageEnglish
DOI10.1021/acs.nanolett.9b00649
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