HOME > 論文 > 書誌詳細Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS dataAtsushi Machida, Kenji Nagata, Ryo Murakami, Hiroshi Shinotsuka, Hayaru Shouno, Hideki Yoshikawa, Masato Okada. Journal of Electron Spectroscopy and Related Phenomena 273 147449. 2024.https://doi.org/10.1016/j.elspec.2024.147449 Open Access Elsevier BV (Publisher) Materials Data Repository (MDR) NIMS著者永田 賢二篠塚 寛志吉川 英樹Materials Data Repository (MDR)上の本文・データセットMDRavailable Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data 作成時刻: 2025-07-16 03:07:25 +0900 更新時刻: 2026-07-29 06:20:16 +0900
