HOME > Article > DetailBayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS dataAtsushi Machida, Kenji Nagata, Ryo Murakami, Hiroshi Shinotsuka, Hayaru Shouno, Hideki Yoshikawa, Masato Okada. Journal of Electron Spectroscopy and Related Phenomena 273 147449. 2024.https://doi.org/10.1016/j.elspec.2024.147449 Open Access Elsevier BV (Publisher) Materials Data Repository (MDR) NIMS author(s)NAGATA, KenjiYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)MDRavailable Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data Created at: 2025-07-16 03:07:25 +0900 Updated at: 2026-11-02 06:25:13 +0900
