HOME > 会議録 > 書誌詳細The characterization of Electronic state from Surface to Several Nanometer Region on MgO:Si Thin FilmMikihiko Nishitani, Mutsumu Fukada, Yukihiro Morita, Masaharu Terauchi, Tessei Kurashiki, Hiroki Tsuchiura, Yasushi Yamauchi. Mater. Res. Soc. Symp. Proc. 9999-9999. 2012.https://doi.org/10.1557/opl.2012.29 NIMS著者山内 泰Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 02:10:11 +0900更新時刻: 2025-01-13 04:57:10 +0900
